The invention discloses a reflected near-field Lamen spectrometer measuring head based on local field reinforcing elementary of metal nanometer probe in the near-field optical, spectrum analytical detector technical domain, which is characterized by the following: adjusting the incidence angle of the excited light and the collecting angle of near-field Lamen spectrum signal; collecting the near-field Lamen spectrum signal from different directions; realizing multiple measuring patterns; improving the exciting efficiency and collecting efficiency of near-field Lamen spectrum signal effectivelyas well as the signal-to-noise ratio and detecting sensitivity; obtaining the nanometer size shape image, hyper-diffraction resolution near-field Lamen spectrum and near-field Lamen spectrum image simultaneously. adopting paralleling beam interface to combine with each kind of Lamen spectrometer or commercial Lamen spectrometer; fitting for dielectric size study in the biological, medical, chemical, physical and material domains widely.