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发明授权
CN101192596B 具有对准标记的半导体器件以及显示设备 失效 - 权利终止

具有对准标记的半导体器件以及显示设备
摘要：
一种半导体器件(10)，其包括半导体衬底(16)和对准标记(1)。对准标记(1)提供于半导体衬底(16)上并且可光学检测。对准标记(1)包括亮区(101)和暗区(102)。亮区(101)输出从半导体衬底(16)表面反射的光。暗区(102)包括金属布线(14)，输出从金属布线(14)表面反射的光，并且其亮度低于亮区的亮度。
摘要（英）：

A semiconductor device includes a semiconductor substrate and an alignment mark. The alignment mark is provided on the semiconductor substrate and optically detectable. The alignment mark includes a bright area and a dark area. The bright area outputs light reflected from a surface of the semiconductor substrate. The dark area includes metal wirings, outputs light reflected from surfaces of the metal wirings, and has brightness lower than that of the bright area.

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