The invention relates to a test method of a pin element. The method comprises the following steps: providing a test support board which is provided with a plurality of test contacts; providing a test daughter board which is provided with a plurality of conductors throughout the top surface of the test daughter board to the bottom surface of the test daughter board, wherein, drop height forms on the test daughter board, and the test daughter board is arranged on the test support board, and the conductors are correspondingly contacted with the test contacts; arranging a conductive gasket on thetest daughter board, wherein, the conductive gasket correspondingly contacts the conductors of the test daughter board; and arranging an object to be tested on the conductive gasket, wherein, the object to be tested is provided with a plurality of pins which contacts the conductive gasket, the object to be tested is pressed so that the pins of the object to be tested, the conductive gasket, the conductors of the test daughter board are electrically connected with the test contacts of the test support board to test the object to be tested. The invention further provides a test device for the pin element.