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发明授权
CN101515018B 电路检测回路及制造使用方法 失效 - 权利终止

电路检测回路及制造使用方法
摘要：
本发明提供一种电路检测回路及其检测方法。电路检测回路包含第一基板及第二基板。第一基板上设有多个接点以及多条第一基板线路。第一基板线路的两端分别连接至二接点，且被连接的二接点非为最近距相邻的接点。第二基板包含设有多个焊点以及多条第二基板线路。第二基板线路的两端分别连接至二焊点，且被连接的二焊点非为最近距相邻的焊点。焊点分别与接点焊接以形成电性独立的第一回路及第二回路。藉由检测第一回路及第二回路间的讯号变化或电性特征，即可测试第一回路及第二回路间是否有短路产生。
摘要（英）：

The invention provides a circuit detection loop and a detection method thereof. The circuit detection loop comprises a first substrate and a second substrate. The first substrate is provided with a plurality of connecting points and a plurality of first substrate lines. The two ends of each first substrate line are connected to two connecting points which are not two adjacent connecting points with the shortest distance inbetween respectively. The second substrate comprises a plurality of welding points and a plurality of second substrate lines. The two ends of each second substrate line are connected to two welding points which are not two adjacent welding points with the shortest distance inbetween respectively. The welding points are welded with the connecting points to form electrically-independent first and second loops. The short circuit between the first loop and the second loop can be tested by detecting the signal change or the electric characteristics between the first loop and the second loop.

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