The present invention provides a check apparatus. When performing lighting light check and the lighting is poor, the reason for poor lighting is the poor of panel or contact can be easily judged. The The present invention provides a check apparatus. When performing lighting light check and the lighting is poor, the reason for poor lighting is the poor of panel or contact can be easily judged. Thecheck apparatus checks the lighting of the check object panel. The check apparatus comprises multiple probe combinations with probes directly contacting with the electrodes of the check object panel acheck apparatus checks the lighting of the check object panel. The check apparatus comprises multiple probe combinations with probes directly contacting with the electrodes of the check object panel and a probe pedestal supporting the probe combinations, wherein the multiple probe combinations comprise a probe combination for simple contact, which simply contacts with the check object panel for sind a probe pedestal supporting the probe combinations, wherein the multiple probe combinations comprise a probe combination for simple contact, which simply contacts with the check object panel for simple lighting check, and a probe combination for all contact, which fully contacts with the check object panel for universal lighting check.mple lighting check, and a probe combination for all contact, which fully contacts with the check object panel for universal lighting check.