中科微点-全球专利检索

  1. Login
  2. Sign Up
Invention Publication
CN101566958A 检测处理器资源的架构易损性 失效 - 权利终止

检测处理器资源的架构易损性
Abstract:
本发明的名称为“检测处理器资源的架构易损性”。在一个实施例中，提供一种时间片检测器以基于处理器度量标准来检测处理器的易损性测量，每个处理器度量与时间片期间的处理器结构的操作相关联，还提供控制器以基于易损性测量来控制错误缓解单元。对其他实施例进行了描述并要求其权利。
Abstract(English):

In one embodiment, a quantum detector is provided to detect a vulnerability measure for a processor based on a processor metrics each associated with operation of a processor structure during a quantum, along with a controller to control an error mitigation unit based on the vulnerability measure. Other embodiments are described and claimed.

Public/Granted literature
Patent Agency Ranking
0/0