Aiming at the defects of connecting wires and broken wires of A1 film electrodes produced in the preparation process of a plasma display panel (PDP) with an A1 film electrode structure, the invention provides a rapid and reliable detection method and a device thereof. The method comprises the steps of confirming, positioning and storing defect information, and transmitting the information among laser repairing machines by combining a positive film with a negative film of a mask plate, utilizing the comparison of defect emitting light intensity transmittance and using a control system. Aiming at solving the problem that after the defects of A1 film electrode broken wires are repaired, the A1 film electrode wires are broken again through high temperature processing, the invention provides amethod for sintering a repairing point after presintering together with a dielectric layer prepared in subsequent process, thus effectively repairing the defects of A1 film electrode broken wires.