The invention discloses a topology structure and a method used for multi-function measurement. In the topology structure, a signal input end A and a signal input end B are connected with an input end of a signal buffer circuit (12) through an isolation resistor RX; an output end of the signal buffer circuit (12) is connected with input ends of a comparator (17) and a filter (20); the output end of the filter (20) is connected with the input end of an A/D converter (21); the output end of a microcontroller (16) is connected with the input end of display equipment (19); the output end of the signal buffer circuit is respectively connected with the input ends of a signal polarity discrimination circuit (13) and a signal phase inverting circuit (14); the output end of the signal polarity discrimination circuit (13) is connected with the input end of the microcontroller; and the output end of the signal phase inverting circuit is connected with a second input end (15-2) of an electronic switch KX. Due to the adoption of the topology structure, the trouble in switching test pen jack positions is avoided; a dial plate is controlled by a button directly instead of a knob switch; the probability of burning out a fuse is reduced; and great convenience is provided for a user.