利索-全球专利检索

  1. 登录
  2. 注册
发明公开
CN101960297A X射线计算机断层成像装置和采用X射线计算机断层成像检测对象的方法 有权

X射线计算机断层成像装置和采用X射线计算机断层成像检测对象的方法
摘要：
在X射线计算机断层成像装置(1)和采用X射线计算机断层成像检测对象(2)的方法中，为改善图像质量，通过第一强度测量装置(13)测量X射线源(3)和对象(2)之间的X射线辐射(6)的第一强度，通过第二强度测量装置(15)测量在对象(2)和X射线检测器(4)之间位于对象(2)的投影区域(10)之外的X射线辐射(6)的第二强度。可通过所测量强度计算散射辐射校正因子以减小散射辐射。
摘要（英）：

In an X-ray computer tomograph (1) and a method for analyzing an object (2) by means of X-ray computer tomography, in order to improve the image quality a first intensity of the x-ray radiation (6) between an X-ray source (3) and the object (2) is measured by way of a first intensity measuring device (13), and a second intensity of the X-ray radiation (6) between the object (2) and an X-ray detector (4) outside of a projection region (10) of the object (2) is measured by way of a second intensity measuring device (15). A scattered radiation correction factor may be calculated for scattered radiation reduction by means of the intensities measured.

公开/授权文献
0/0