The invention provides a novel time-resolved Raman scattering method and device, namely a time-resolved Raman scattering characteristic spectrum analyzer, aiming at the problem that the common Raman spectrometer has the defects of fluorescence background interference, low time resolution and lower trace analysis detection speed. In the invention, a multielement strip silicon photo-multiplier detector (SiPM) with high gain and high response speed is used as a photodetector, and a Raman signal is measured by combining a time-correlated single photon counting (TCSPC) method with the photodetector, therefore, the time-resolved Raman scattering characteristic spectrum analyzer has time resolution of a picosecond order of magnitude and single photon counting detectivity. The time-resolved Ramanscattering characteristic spectrum analyzer not only can be independently used as a Raman scattering characteristic spectrum analyzer for rapidly judging whether a sample contains a plurality of compositions synchronously by using the characteristic spectrum of the Raman scattering, or for accurately identifying the compositions through scanning the complete Raman spectrum of the detection sampleby a grating monochromator, but also can be used as a function expansion module based on the traditional Raman spectrometer for enhancing the time resolution, reducing the fluorescence background interference, and increasing the signal to noise ratio and the detection speed.