The invention discloses a test method for an SOC (System On Chip) based on a reference vector and a bit mask, which relates to the test method for the SOC. According to the test method, the problem that the compression ratio is required to be improved when a traditional test method is used for detecting an IP (Internet Protocol) is solved. The test method comprises the following steps of: compressing test data; secondly, transmitting and storing the compressed data on an ATE (Automated test equipment); thirdly, decompressing the compressed data through a decompression structure on the chip and reducing into test data; and fourthly, testing the SOC by using the test data. The compression process in the first step comprises the following specific substeps of: a, dividing a test set TD (Table Data) according to a target sub vector; b, selecting the sub vector with highest centralized repetition rate; c, coding each test vector; and d, integrating into a compressed test vector. The test method is used for testing the SOC based on the reusable IP (Internet Protocol) core design.