The invention provides a pulse high-current amplitude calibrating device for a semiconductor device test system. The device comprises the following components: an NI PXI-1042 master control box, an NI PXI-4071 high-speed data acquisition unit, a TDS320 digital oscilloscope, and a test adaptor special for the semiconductor device test system. An average value is solved by arranging relative equipment and processing acquired pulse signal data and serves as a calibration result. The device can solve the problem about calibration of pulse high-current source amplitude for the semiconductor devicetest system in the field of communication at present.