The invention discloses a method for quantifying an analyzed result of an electronic probe line/plane. The method comprises the following steps of: firstly, carrying out line analysis and plane analysis on a segregation region; and combining a working curve to carry out quantification treatment on line and plane analyzed results, so as to obtain a quantitative distribution state of segregation region elements, wherein the accuracy of the results can be compared favorably with quantitative point analysis, the detection efficiency is greatly improved and the influences caused by external reasons on the results are smaller. The analysis method provided by the invention is simple and feasible, can be used as a common analysis skill to be popularized and applied in daily detection, and can provide more direct and accurate reference data.