The invention relates to an ionic current collection test device and a method for satellite tail regions, and belongs to the field of space charging and discharging effect current collection. The device comprises a metal disc, a current collection electrode, a current meter, a plasma diagnosis system, a Kaufmann ion source, a vacuum-pumping system, a high-voltage bias power supply, a personal computer (PC), a vacuum chamber and lamp filaments. The method comprises turning on the vacuum-pumping system to vacuumize the vacuum chamber; turning on the lamp filaments to enabling the lamp filaments to emit electronic currents; turning on the Kaufmann ion source, and imposing ion accelerating voltages on an ion source grid to enable the ion source to emit ion beams; and turning on the high-voltage bias power supply, and imposing bias voltages on the current collection electrode, reading ion collection currents under different bias voltages through the current meter, and drawing an I-V characteristic curve between the ion collection currents and the imposed bias voltages. By means of the ionic current collection test device and the method for satellite tail regions, ion current collection situations of different charging potentials and different positions of satellite tail regions are measured.