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发明公开
CN103226508A 一种表征微控制器内核工作负载情况的方法 无效 - 驳回

一种表征微控制器内核工作负载情况的方法
摘要：
本发明公开了一种表征微控制器内核工作负载情况的方法，包括在所述微控制器中设置一个标志位；根据程序段对于所述微控制器内核的访问量在程序段中设置标志位数据；所述微控制器内核运行在执行所述程序段时，根据所述程序段的标志位数据改变所述标志位；在所述微控制器执行完所述程序段之后恢复所述标志位。本发明采用微控制器内的标志位表征微控制器内核工作负载情况，不附加采用物理方案表征微控制器内核工作负载，减小了芯片的表面积。
摘要（英）：

The invention discloses a method for characterizing a kernel working load condition of a microcontroller, which comprises the following steps: setting a zone bit in the microcontroller; setting zone bit data in a program segment for the visitor volume of the kernel of the microcontroller according to the program segment; when the kernel of the microcontroller operates in the program segment, changing the zone bit according to the zone bit data of the program segment; and recovering the zone bit when the microcontroller executes the program segment. According to the invention, the zone bit in the microcontroller is adopted to characterize the kernel working load condition of the microcontroller without adding a physical scheme, so that the surface area of a chip is reduced.

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