The invention provides a total-reflection optical imaging system which comprises an external entrance pupil, a third reflector and a first reflector, wherein the external entrance pupil, the third reflector and the first reflector are sequentially arranged from left to right along the optical axis of the system. A second reflector is arranged on the right upper portion of the third reflector, the focal plane of the imaging system is located on the left lower portion of the third reflector, the first reflector and the second reflector are spherical reflectors, the third reflector is an oblate ellipsoid reflector, the sphere center of the reflection face of the first reflector and the sphere center of the reflection face of the second reflector are overlapped, the overlapped portion is located on the rotation symmetry axis of the reflection face of the third reflector, the rotation symmetry axis of the reflection face of the third reflector and the optical axis of the system are overlapped, and an included angle is formed between the external entrance pupil and the optical axis of the system. The total-reflection optical imaging system is provided with a shared optical axis, an external aperture and linear view field, is telecentric in image space, and is used in a bias view field and suitable for serving as a static interference imaging spectrometer.