Devices and methods are provided that facilitate improved input device performance. The devices and methods utilize a first electrode and a second electrode disposed on a first substrate and a deformable electrode structure. The deformable electrode structure overlaps the first electrode and the second electrode to define a variable capacitance between the first electrode and the second electrode that changes with the deformation of the deformable electrode structure. The deformable electrode structure comprises a spacing component configured to provide spacing between the deformable electrode structure and the first electrode and the second electrode. Finally, a transmission component is configured such that biasing the transmission component causes the deformable electrode structure to deform and change the variable capacitance. A measurement of the variable capacitance can be used to determine force information regarding the force biasing the transmission component.