The invention relates to an item inspection device using a distributed X-ray source. The item inspection device comprises a rack, an item channel, an item conveying device, the distributed X-ray source capable of sequentially generating x-rays at different positions in each working period, a detector array used for receiving the x-rays from the distributed X-ray source and outputting signals representing the intensity of the x-rays, an electronics system used for receiving signals from detectors, converting the signals into digital signals which form data packets with position numbers of corresponding detectors, and outputting data packet sequences formed by multiple detector signals of the detector array and the position numbers, an image processing system used for receiving output from the electronics system, processing the position numbers of the detectors and the corresponding signals representing the intensity of the x-rays, and constructing and forming images of items to be inspected, a ray source power supply used for supplying power for the distributed X-ray source, and a control system used for logic control for all sub-units to enable all subsystems to work in a coordinative manner.