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发明授权
CN103913639B 测量阻性结构电阻的方法和系统 有权 转让

测量阻性结构电阻的方法和系统
摘要：
本发明公开了用于测量阻性结构的电阻的方法和系统，所述阻性结构具有至少三个节点。通过测量没有校准电流注入到阻性结构的第一和第二节点之间的第三结点时电阻结构的一个输出端上的电压来确定第一校准信号。然后向第三节点注入校准电流，以及确定第二校准信号。确定第一校准信号和第二校准信号之间的差的绝对值，该绝对值与阻性结构的电阻值和校准电流的乘积成比例。
摘要（英）：

Method and system for measuring the resistance of a resistive structure having at least three nodes. A first calibration signal is determined by measuring a voltage at an output of the resistance structure when no calibration current is injected into a third node between the first and second nodes of the structure. A calibration current is then injected into the third node and a second calibration signal is determined. The absolute value of the difference between the first calibration signal and the second calibration signal is determined, the absolute value being proportional to a product of the resistance of the resistive structure and the calibration current.

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