The invention discloses a general information processing platform based on an automated testing system. The general information processing platform comprises a level switch unit 1, a single chip microcomputer processing unit 2 and an FPGA processing unit 3, wherein the level switch unit 1, the single chip microcomputer processing unit 2 and the FPGA processing unit 3 are connected into a whole. The level switch unit comprises an input and output interface J1, a 3.3 V/2.5 V voltage conversion module U1 and an RS232/CMOS level mutual conversion module U2. The single chip microcomputer processing unit comprises a single chip microcomputer processing module U3. The FPGA processing unit 3 comprises an FPGA processing module U4 and an output interface J2. According to the general information processing platform based on the automated testing system, a concise and clear distributed layout way is adopted for orderly ranking all units on a printed board, concentrated interfaces are adopted for reasonably leading out key pins, and good data interaction between an external computer and base layer hardware is achieved. The general information processing platform has the advantages of being reasonable in design, compact in structure, good in stability, easy to debug, high in reliability and the like.