The invention relates to a semiconductor point type temperature measurement system. According to the system, temperature measurement is carried out on a tested object by measuring the intensity of reflected light of semiconductor materials through the characteristic that the light reflectivity of the semiconductor materials is changed along with the change of temperature when the incident light wavelength is not changed. The semiconductor point type temperature measurement system has the advantages that high insulativity is achieved, electromagnetic interference and corrosion resisting is achieved, explosion preventing and lightening protection are achieved, the system can work under severe environment, measurement precision is high, the range is large, responses are sensitive, a temperature detection probe is simple in structure, small in size and convenient to mount, and detection can be achieved in a multi-unit networking mode.