A single-chip Z-axis linear magnetic resistance sensor with a calibration coil and/or a reset coil comprises a single-chip Z-axis linear magnetic resistance sensor body and the calibration coil and/or the reset coil, wherein the calibration coil and the reset coil are plane or three-dimensional coils. The plane coil is located above a substrate, below magnetic resistance sensing units, between the magnetic resistance sensing units and a soft magnetic flux concentrator, above the soft magnetic flux concentrator or at a gap. The three-dimensional coil is wound around the soft magnetic flux concentrator and the magnetic resistance sensing units. The calibration coil and the reset coil each comprise a straight wire parallel to the magnetizing direction of a nailing layer/a free layer, wherein the calibration coil produces an equivalent calibration magnetic field in the direction towards or away from the nailing layer at the positions where magnetic resistance unit strings are pushed and pulled; the reset coil produces a uniform reset magnetic field in the direction towards the free layer at the positions of all the magnetic resistance sensing units. By controlling currents of the calibration coil/the reset coil, the calibration and magnetic state reset can be achieved for the single-chip Z-axis linear magnetic resistance sensor body, and the single-chip Z-axis linear magnetic resistance sensor has the advantages of being high in efficiency, rapid, convenient to operate and the like.