Charged-particle microscopy with enhanced electron detection. A method of investigating a flux of output electrons emanating from a sample in a charged-particle microscope, the method comprising the following steps: - Using a detector to intercept at least a portion of the flux so as to produce a set {I} of pixeled images I of at least part of the sample, whereby the cardinality of the set {I} is M > 1. - For each pixel pi in each image Ij , determining the accumulated signal strength S , thus producing an associated set of signal strengths {S}. - Using the set {S} to calculate the following values: an average signal strength S per pixel position i; and a variance sigma<2>S in S per pixel position i. - Using these values S and sigma<2>S to at least one map of said part of the sample, selected from the group comprising: a first map, representing variation in energy of detected electrons as a function of position; and a second map, representing variation in number of detected electrons as a function of position.