The invention provides a backup method for an SOC crystal oscillator circuit. The method includes the steps: arranging a first crystal oscillator circuit and a second crystal oscillator circuit on a bare chip, and arranging test circuits on the bare chip and a chip packaging substrate; and during a bare chip test stage after the bare chip is produced, carrying out crystal oscillator circuit tests on the first crystal oscillator circuit and the second crystal oscillator circuit through the test circuits, and then taking a corresponding handling step after test results enable the bare chip to be divided into three types of bare chips: a bare chip that enables both the first crystal oscillator circuit and the second crystal oscillator circuit to work, a bare chip that enables only the second crystal oscillator circuit to work, and a bare chip that enables neither the first crystal oscillator circuit nor the second crystal oscillator circuit to work. Through the above method, new crystal oscillator circuits can be utilized if the new crystal oscillator circuits can work, and also mature crystal oscillator circuits can be directly utilized through convenient packaging and modification if the new crystal oscillator circuits cannot work. In this way, the high performance of new circuits is achieved, and also risks of design of the new circuits are avoided.