The invention discloses an infrared detecting method for automatically locating a detecting position and matched detecting equipment. A sample is detected in an electric work state, the actual position is firstly acquired through a visible light image, then an infrared temperature image of the sample to be detected is collected, the temperature difference area of the infrared temperature image and the background is compared and extracted, the area, temperature and position changes of the temperature difference area are observed and are finally compared with the reference value of a standard sample and a tolerant difference value, and a quality report of the sample is obtained. When the sample is in the electric work state, infrared radiation can be actively emitted, and hidden disadvantages and quality defects, shown after long-time running and work, of the sample can be detected. Meanwhile, in the detecting process, a key area can be concerned, a more precise infrared temperature image can be acquired, the detecting position and a detecting view field can be located and adjusted at any time, and detecting efficiency is improved.