The invention relates to a processor board card parameter lossless automatic test method and a monitoring host device. The method comprises the following steps: a PC obtains existing configuration information output by a processor through a first communication interface and keeps the configuration information, and meanwhile, outputs corresponding test configuration information to a processor board card to be tested; the PC downloads a function test software sample of the processor through a second communication interface; the PC starts the function test software sample and carries out function test of the processor according to a command of the first communication interface; test information and results are sent back to the PC through the second communication interface; and the PC restores the configuration information for the processor board card to be tested through the first communication interface. The method is suitable for constructing a lossless automatic test scheme of operating parameters of the processor having an Ethernet and a serial port and an embedded operating system.