The invention relates to a simulation device of a satellite deep charging and discharging phenomenon. The simulation device includes a particle beam generation device, a vacuum tank, a vacuum maintaining subsystem, a particle detector and a test data subsystem. The particle beam generation device is used for generating high-energy electron beams, wherein the high-energy electron beams irradiate on a test sample; the vacuum tank is used for providing a vacuum chamber space for the simulation device; the vacuum maintaining subsystem is used for maintaining a vacuum environment for the vacuum tank; and the particle detector is used for detecting particle beams to determine whether particle input is normal; and the test data subsystem is used for acquiring data for a simulation test.