The invention relates to a reflection type integrated device for sub-Doppler polarized spectrums. The reflection type integrated device comprises a laser light source, a spectroscope, a quarter wave plate, an atom air chamber, a polarizer, a reflecting mirror, a polarization analyzer, a first photoelectric detector and a second photoelectric detector, wherein laser sent out by the laser light source is divided into two routes via the spectroscope, and one route of laser is emitted outward; the other route of laser reaches the reflecting mirror after orderly going through the quarter wave plate, the atom air chamber and the polarizer, then returns along an original light path after being reflected by the reflecting mirror, and orderly passes the polarizer, the atom air chamber, the quarter wave plate and the spectroscope before arriving at the polarization analyzer. The laser is divided by the polarization analyzer into two routes of laser light that are vertical to the polarization direction, and the two routes of laser light are respectively received by the first photoelectric detector and the second photoelectric detector; the reflection type integrated device improves stability and integration property of the sub-Doppler polarized spectrums, and the precision, the stability and the integration level of relevant specific applications can be substantially raised.