A piezoelectric driving double-shaft tilt sample rod for a transmission electron microscope provided by the invention mainly comprises a holding handle, a sample rod body, a sample rod head and a sample bottle configured to holding a sample. The sample bottle is fixed with a [Beta] shaft, the [Beta] shaft is rotatably connected with the sample rod head; the sample rod head is provided with a driving piece configured to drive the [Beta] shaft to rotate step by step, the driving piece is tightly contacted with the [Beta] shaft, and when the driving piece is moved from a first position to a second position, the [Beta] shaft steps into an angle stroke [Theta]'; when the driving piece is reset from the second position to the first position, the [Beta] shaft is fixed; and the driving piece is moved from the first position to the second position and reset from the second position to the first position to form a movement period, the rotation angle of the [Beta] shaft is equal to N*[Theta]', wherein N is the number of the movement period. According to the invention, the size of a device configured to drive the sample rod to rotate around the [Beta] shaft is small, and the inclination angle can exceed 30 degrees.