The invention relates to a polyimide film surface charge characteristic analysis method. The polyimide film surface charge characteristic analysis method includes the following steps that corona charging is conducted on a polyimide film sample; the polyimide film sample subjected to corona charging is rapidly detected, a change value of surface potential of the polyimide film sample with time is detected, data V(t) are recorded, wherein the V represents the surface potential, and t represents time; the relation about the product of the time with a derivative of the V(t) to the time and the time is obtained, namely tdV(t)/dt-logt; a curve corresponding to the tdV(t)/dt-logt is made, and characteristics of surface charge accumulation and dissipating capability of a polyimide film are evaluated according to the state of the curve. The method and a device do not need destroy the polyimide film, can achieve nondestructive detection, the operating process is simple and convenient, and the situations of the surface charge accumulation and dissipating capability of the sample can be visually, accurately and effectively evaluated.