The invention discloses a probe scanning measuring mechanism and a probe scanning measuring method. The probe scanning measuring mechanism is used for cooperation with a rotation device used for rotating an insulator, and comprises a rotation driving mechanism, a linear driving mechanism, a probe support, and a measuring probe. The output shaft of the rotation driving mechanism is connected with the moving shaft of the linear driving mechanism. The first end of the probe support is connected with the linear driving mechanism, and the second end of the probe support is connected with the measuring probe. The probe scanning measuring mechanism and the probe scanning measuring method are advantageous in that the rotation control of the insulator is not required to be designed additionally, and the moving control is simple, and therefore the complete coverage scanning measurement of the surface of the insulator is realized; after the scanning measuring is ended, the probe support is rotated to be close to a cavity housing inner side of an insulator surface charge measuring experimental device, and therefore the structure is simple and compact, the occupied size is small, the inner space of the experimental device is saved, the gas consumption of the experimental device is reduced, and the experiment time is reduced.