The invention discloses a testing method and apparatus for an LTCC substrate with an inwardly embedded micro channel. The method comprises: initial detection is carried out on an LTCC substrate sample; and low-temperature storage testing, high-temperature storage testing, and high-and-low temperature loop testing are carried out on the LTCC substrate sample after initial detection and the LTCC substrate sample after testing each time is detected. With the method and apparatus, a series of environment item testes like low-temperature storage, high-temperature storage, and temperature circulation are carried out on the LTCC substrate with an inwardly embedded micro channel, thereby detecting a non-destructive quality and a structural integrity situation of the LTCC substrate with an inwardly embedded micro channel and thus obtaining a qualitative conclusion of reliability of the substrate in ground simulation using environment.