The invention discloses a chip test device, which comprises a test platform and a plurality of test bases, wherein each test base is provided with a magnetic pole; and the test platform is provided with magnetic sensors corresponding to the magnetic poles respectively and used for outputting electrical signals. The invention also discloses a chip test system. Through the mode above, the chip test device and system can prevent the test bases from being installed to the positions not corresponding to test stations according to the output electrical signals.