The invention discloses a Beidou high-precision measurement method based on a comprehensive analysis method. The Beidou high-precision measurement method is characterized by comprising the steps of firstly dividing a monitoring time period into a plurality of sub time periods, and respectively calculating a positioning result of each sub time period; then determining the accuracy of the positioning result of each sub time period by adopting the comprehensive analysis method according to positioning precision influencing elements such as a DOP value, an error source and the number of epoches of each sub time period; and finally working out a final positioning result of the whole monitoring time period by using positioning accuracy weighting. The Beidou high-precision measurement method comprehensively analyzes various elements influencing the positioning precision, enables the final positioning result to reach higher precision, and has wide application prospects.