The invention relates to a fiber-based atomic force microscope probe and an atomic force microscope system. The fiber-based atomic force microscope probe comprises a probe pin and a micro cantilever beam; and the probe pin is arranged at one end of the micro cantilever beam arranged at one end of a fiber. A fiber F-P cavity is formed between the micro cantilever beam and one end surface of the fiber by a connecting arm. And the micro cantilever beam is used for sensing a change of a distance between the probe pin and a sample. When the length of the F-P cavity changes due to deformation of the micro cantilever beam, the reflected light intensity is modulated by the fiber F-P cavity.