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发明授权
CN106526918B 一种显示基板及其测试方法 有权

一种显示基板及其测试方法
摘要：
本发明公开了一种显示基板及其测试方法，该显示基板包括：测试引线，同时与第一栅极驱动电路和第二栅极驱动电路电连接；高垂直排列制程测试焊盘，设置在测试引线的至少一端；第一阵列测试焊盘，与第一栅极驱动电路电连接，且与测试引线相连接形成第一连接点；第二阵列测试焊盘，与第二栅极驱动电路电连接，且与测试引线相连接形成第二连接点；开关单元，形成在测试引线的第一连接点和第二连接点之间，用于控制测试引线导通或断开。实现了在高垂直排列固化制程时，显示基板的两个栅极驱动电路同时打开工作，在对栅极驱动电路进行阵列测试时，对两个栅极驱动电路分别进行测试。
摘要（英）：

A display substrate and a test method thereof are disclosed. The display substrate includes a test wire connected to a first gate driving circuit and a second gate driving circuit; a high vertical alignment process test pad disposed on at least one side of the test wire; a first array test pad electrically connected to the first gate driving circuit and connected to the test wire to form a first connection node; a second array test pad electrically connected to the second gate driving circuit and connected to the test wire to form a second connection node; and a switch unit formed between the first connection node and the second connection node for controlling the test wire to connect or disconnect.

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