The invention relates to a high-signal-to-noise ratio infrared detector ADC sampling circuit, which comprises a signal impedance matching unit, a signal level matching unit, a filtering unit, an ADC conversion unit, a digital signal conversion unit, and a power supply unit. Analog voltage outputted by a cold-type long wavelength infrared detector is subjected to impedance matching through a single-end operational amplifier, and signal losses in a transmission line can be reduced; level matching is then carried out through a differential operational amplifier; noise is reduced through the filtering unit; the analog voltage outputted by the detector can be sampled by the high-bandwidth and high-signal-to-noise ratio ADC; data outputted by the ADC are transmitted to an FPGA, converted to a Camera Link format and outputted; and the power supply unit provides needed power for the other units. The high-signal-to-noise ratio infrared detector ADC sampling circuit has the advantages that due to the high-signal-to-noise ratio infrared detector ADC sampling circuit design, signal-to-noise ratio conversion as high as 78 dB can be achieved, normal work in a wide temperature (-50 DEG to +70DEG) condition can be realized, Camera Link-format data output can be realized, the environmental adaptability is strong, and the application range is wide.