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发明公开
CN106680608A 一种利用GTEM小室评价特高频传感器的方法 无效 - 驳回

一种利用GTEM小室评价特高频传感器的方法
摘要：
本发明提供了一种利用GTEM小室评价特高频传感器的方法，包括步骤1：确定GTEM小室中特高频传感器的测试区域；步骤2：设定信号发生器的信号输出曲线；步骤3：将特高频传感器放置在测试区域内，控制所述信号发生器按照信号输出曲线进行输出，记录在信号输出曲线中每个频率点下的特高频传感器输出信号的电压峰值；步骤4：依据测试区域的场强和所述电压峰值计算每个频率点的等效高度。与现有技术相比，本发明提供的一种利用GTEM小室评价特高频传感器的方法，能够有效测试特高频传感器的等效高度值，通过求取预置频率范围内的平均等效高度作为评价传感器性能的指标。
摘要（英）：

The invention provides an ultrahigh-frequency sensor evaluation method by utilizing a GTEM cell. The method comprises the following steps that 1) a test area of an ultrahigh-frequency sensor in the GTEM cell is determined; 2) a signal output curve of a signal generator is set; 3) the ultrahigh-frequency sensor is placed in the test area, the signal generator is controlled to carry out output according to a signal output curve, and the voltage peak of an output signal of the ultrahigh-frequency sensor in each frequency point of the signal output curve is recorded; and 4) the equivalent height of each frequency point is calculated according to the field intensity of the test area and the voltage peak. Compared with the prior art, the method of the invention can test the equivalent height of the ultrahigh frequency sensor effectively, and the average equivalent height in a preset frequency range is calculated and serves as an index for evaluating the sensor performance.

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