Provided is a device for testing normal spectral emissivities of infrared transparent materials. The device includes a sample heating and temperature-control subsystem, a vacuum sealing subsystem, a Fourier infrared spectrometer, a computer and a standard blackbody. According to the device, accurate measurement of the emissivities of medium-wave, short-wave and long-wave infrared transparent materials at the temperature from 300K to 800K can be achieved, the device has the advantages of being high in utilization rate and easy and convenient to operate, and the spectral emissivities of different kinds of infrared transparent materials at medium and high temperatures can be tested.