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发明公开
CN106841954A 一种基于光纤光栅实时测温的GIS局部过热性故障模拟实验装置 无效 - 驳回

一种基于光纤光栅实时测温的GIS局部过热性故障模拟实验装置
摘要：
本发明涉及一种基于光纤光栅实时测温的GIS局部过热性故障模拟实验装置，主要包括直流电源、固态继电器、过热性故障模拟元件、PID温度控制仪、光纤光栅温度传感器及光纤光栅解调仪。本发明可广泛用于SF6气体绝缘电气设备中局部过热性故障的模拟，适用于研究SF6气体绝缘电气设备外壳与故障源温度的反演算法，为科研、教学、研究院所和设备制造厂家及电力系统中对SF6气体绝缘电气设备设备在线状态检测的理论分析和应用研究，提供了一种简单易用的方法。
摘要（英）：

The invention relates to a local overheat fault simulation experiment device for a GIS based on real-time temperature measurement of a fiber grating. The local overheat fault simulation experiment device mainly comprises a DC power supply, a solid-state relay, an overheat fault simulation element, a PID temperature controller, a fiber grating temperature sensor and a fiber grating demodulator. The local overheat fault simulation experiment device can be widely applied to simulation of a local overheat fault in SF6 gas insulated electric equipment, and is suitable for research on an inverse algorithm for temperatures of a housing of the SF6 gas insulated electric equipment and a fault source; and a simple and easy-to-use method is provided for scientific research, teaching, research institutes, equipment manufacturers and power systems for theoretical analysis and application research of online state detection of the SF6 gas insulated electric equipment.

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