The invention provides an automatic scanning and transmitting type probe device, and belongs to the field of plasma science and technology. The device comprises a computer, a data acquisition card, an isolation operational amplifier, a probe heating circuit, a probe bias circuit and a probe. The analog output channel (a) of the data acquisition card is connected with the probe heating circuit through the isolation operational amplifier (a). The output end of the probe heating circuit is connected with the two ends of the probe. The analog output channel (b) of the data acquisition card is connected with the probe bias circuit. The output end of the probe bias circuit is respectively connected with the probe heating circuit and the plasma reference ground. The heating current signal of the probe is collected by the analog input channel (a) of the data acquisition card. The bias voltage signal of the probe and the emitting/collecting current signal of the probe are respectively collected by the analog input channel (b) and the analog input channel (c) of the data acquisition card. According to the technical scheme of the invention, the electronic heating current and the probe bias voltage can be automatically scanned. The measurement process lasts for a short period of time, and is high in efficiency. Meanwhile, the probe is low in working temperature, and has a small disturbance to the plasma. The measurement space is high in resolution precision and the measurement is accurate. Moreover, the probe is not easy to burn out, and is long in service life.