The invention belongs to the technical field of radon measuring instruments, and specifically relates to an electrostatic collection radon measuring device based on a semiconductor refrigeration technology. The device comprises a filter membrane, a sampling pump, a hot side of a semiconductor refrigeration plate, a cold side of the semiconductor refrigeration plate, a collection chamber, a semiconductor detector, an amplifier circuit, a heat insulation layer, and an energy spectrum analysis system. Sample gas enters the collection chamber through the filter membrane and the sampling pump. The collection chamber is surface-mounted on the cold side of the semiconductor refrigeration plate. The semiconductor detector is disposed inside the collection chamber. The amplifier circuit is disposed outside the collection chamber. The cold side of the semiconductor refrigeration plate, the collection chamber and the amplifier circuit are wrapped in the heat insulation layer. A radiator is surface-mounted on the hot side of the semiconductor refrigeration plate. The energy spectrum analysis system is connected with the amplifier circuit. The problem that the humidity of sample gas has an influence on an electrostatic collection radon measuring instrument can be solved. Moreover, the temperature drift problem of the semiconductor detector and the amplifier circuit is solved, the performance requirement on the semiconductor detector and the amplifier circuit is lowered, and the cost of the instrument is reduced greatly.