The invention provides a silicon steel strip specific total loss measuring method under a direct current magnetic bias working condition. The silicon steel strip specific total loss measuring method comprises steps that 1, Epstein Frames of two sizes are used to measure the total loss Pno and Psm of the same group of silicon steel strips under the same direct current magnetic bias working condition; 2, by using a formula: Ploss=(Pno-Psm)L/m deltal L, the specific total loss Ploss of the silicon steel strips is calculated, and L is the total length of every silicon steel strip; delta L is a difference of lengths of every silicon steel strip meausred in the effective quality areas of the Epstein Frames of two sizes; mt is the total weight of the silicon steel strips. The technical scheme provided by the invention is advantageous in that operation is convenient, and is easy to realize; the influences of the non-uniform magnetic flux distribution and the non-uniform loss distribution of the corner double-lap areas of the Epstein Frames under the direct current magnetic bias working condition on silicon steel strip specific total loss measuring results are effectively eliminated, and the specific total loss measuring accuracy of the silicon steel strips under the direct current magnetic bias working condition is improved.