The invention provides a capacitance measurement method for a chip type capacitor element. The capacitance measurement method comprises the steps of A, measuring capacitance, electrode area and electrode thickness of a capacitor with a dielectric plate; B, calculating a gap thickness between the dielectric plate and the electrode; C, measuring the capacitance of the evaporated or sprayed electrode; and D, correcting the measurement result of the dielectric plate according to the gap thickness. By virtue of the capacitance measurement method, material can be saved, waste and loss of unnecessary labor hour also can be avoided, and production efficiency can be optimized.