The present invention belongs to the spectrum technology field, and especially relates to a high-resolution echelle grating spectrometer two-dimensional deviation spectrum analysis and correction method. The method comprises the following steps: the step 1, obtaining the echelle grating spectrometer two-dimensional spectrum; the step 2, performing interpretation of the obtained two-dimensional spectrum; the step 3, performing inversion of deviation values of prism parameters and/or deviation values of echelle grating parameters; and the step 4, performing correction of the echelle grating spectrometer two-dimensional deviation spectrum. The high-resolution echelle grating spectrometer two-dimensional deviation spectrum analysis and correction method can realize qualitative analysis and quantitative calculation of the two-dimensional deviation spectrum, can realize correction work of the two-dimensional deviation spectrogram, and can fully develop the advantages of high spectral resolution, high sensitivity and low detection limit of the echelle grating spectrometer after analysis and correction of the two-dimensional deviation spectrum; and moreover, the correction method only needs to perform small changing of installation and adjustment tools and is simple to operate and easy to realize, etc.