The invention discloses an industrial frequency high voltage placement type measuring device for a coaxially structured high voltage conductor which belongs to the technical scope of electric system current and voltage measurement. The structure of the industrial frequency high voltage placement type measuring device is as follows: the GIS outer housing and the GIS high voltage semiconductor use insulators to form a coaxial structure. The outer circumference of the high-voltage cutting block is sleeved by an insulation ring and is then embedded into the round hole cut out of the semiconductor block. The inner surface of the high voltage semiconductor cutting block and the inner surface of the GIS high voltage semiconductor are connected with a conductive wire respectively to be introduced into a shielding cover with the two conductive wires connected to the ends of a sampling resistor respectively. The optical fiber emission devices are connected in parallel to the ends of the sampling resistor, and then, the optical fibers are guided out of the GIS housing through the insulators. The voltage signal of the sampling resistor is guided out, and with a proportion, the GIS high voltage semiconductor voltage is obtained. According to the invention, not only the high voltage conductor is altered locally, but also the voltage measurement on the high voltage semiconductor can be completed. The alteration process is simple; the device is small in size and low in cost. When used to replace a voltage transformer, it is possible to realize the separation of people from high voltage. The security performance of the device is extremely high.