A method for quickly measuring average critical current of a superconducting film comprises the steps of measuring the geometric dimension of a to-be-measured superconducting film sample; cooling the to-be-measured sample to a superconducting state and performing excitation; scanning and measuring a magnetic induction strength B at a geometric center area of the to-be-measured sample by means of a magnetic field measurement device; determining the coordinate of a geometric center point of the to-be-measured sample by means of a maximal value of B; fixing a magnetic field measuring device at a position right above or right below the geometric center point at a distance h for measuring a magnetic induction intensity B which is generated by the to-be-measured sample at the magnetic field measuring device fixing part; performing all above steps on a superconducting film with known average critical current Ic for obtaining the Bc value of the comparing sample; and according to a relationship among Bc, h, Ic and the geometric dimension of the superconducting film, obtaining value of the h based on the geometric dimension of the comparing sample through measurement, Bc value and the known Ic value, and introducing the value of h, the geometric dimension of the to-be-measured sample and the Bc value into the relationship, thereby obtaining the Ic value of the to-be-measured sample.