The invention relates to a selective storage method for the temperature of a transformer device, including the following steps: S1, getting a working temperature curve of a target transformer device on the current day through continuous acquisition, and acquiring a working temperature historical curve of the target transformer device on a sample day; S2, equally dividing the sample day into time periods, and calculating the temperature deviation coefficient in each time period on the sample day; S3, equally dividing the current day into time periods, and calculating the temperature deviation coefficient in each time period on the current day; and S4, calculating the working temperature storage mark of each time period on the current day, and selectively storing the working temperature in each time period according to the working temperature storage mark. The temperature of the device can be continuously sampled and selectively stored through RFID. The design cost is reduced, and the detection speed is increased. Moreover, the detection frequency of RFID is increased, and the detection accuracy is improved.