The invention discloses a thermal cycling test condition cutting method suitable for different spacecraft electronic equipment. Based on the statistical law of historical fault distribution and thermal fatigue faults of a subsystem and a single-machine stage of an spacecraft, a comprehensive fatigue acceleration index is obtained by using a re-weighting method, and determining criteria and acquisition methods of underlying model parameters of the spacecraft are also provided. According to the thermal cycling test condition cutting method disclosed by the invention, the problem that a thermalcycling test condition cutting formula in MIL-STD-1540B and GJB 1027-2005 'Test Requirements for Launch Vehicles, Upper Stages and Spacecrafts' cannot cover the fault types of all types of the spacecrafts and all types of the subsystems can be solved, and the cost of the spacecrafts can be controlled on the basis of avoiding over-tests and under-tests.