The invention provides a measurement device of a solid material high-temperature direction spectral emissivity and its application, and belongs to the field of measurement of high-temperature materialradiation characteristic; the device comprises a Fourier transform infrared spectrometer, a diaphragm, a plane mirror, an off-axis parabolic mirror, a rotary plane reflective mirror, a black furnace,a heating furnace, an electric control turntable, an electric control turntable control box, a temperature control box and a computer; the heating furnace is composed of an aluminum shell, a heat insulation layer, an electric heating component, a heat transfer copper plate, a sample cover, an inner tank type water cold plate and a temperature thermocouple. The measurement device can remove disturbance of the background radiation, and can reach very good measurement effect without a vacuum cavity device; the measurement cost is low. The temperature uniformity is good when the sample is heatedby the heating furnace, and the influence of the heating furnace on the environment temperature is small, and the environment bias is small; the highest temperature is up to 1200 K. The spectral measurement scale is wide and up to 0.4-20 mu m; the testing time is short, the measurement device has very high resolution rate and sensitivity; the relative testing uncertainty is 1%.